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News

High-resolution atomic force microscope offers maximum imaging versatility

Agilent Technologies Europe : 15 July, 2008  (New Product)
Agilent Technologies a high-resolution atomic force microscope that uses a fully addressable 200mm x 200mm stage to image large samples in air or smaller samples in liquid.
The Agilent 5600LS also enables high-resolution imaging of a small sample area using an AFM or STM scanner. The system’s new, low-noise AFM design (0.05nm) guarantees single atomic steps.

'We have engineered the 5600LS to provide university and industry researchers maximum imaging versatility,' said Jeff Jones, operations manager for Agilent's AFM facility in Chandler, Arizona, USA. 'This high-precision scientific instrument is ideal for a wide range of nanotechnology applications, including semiconductor, data storage, polymers, materials science and life science studies.'

Samples up to 8 inches in diameter and 30mm tall are easily accepted by the 5600LS AFM's 200mm vacuum chuck; the programmable stage can accommodate a 300mm wafer with repositioning. Accurate location mapping (400nm precision) ensures reproducibility. The 5600LS also allows simple, software-driven, point-and-shoot AFM imaging of an area of interest based on an optical view. Motorised optical zoom and focus provide excellent ease-of-use.

Any of Agilent's multipurpose scanners, including open-loop, closed-loop and STM options, can be used with the 5600LS. Open-loop and closed-loop Agilent multipurpose scanners are available in two scan ranges: 90 x 90um, or 9 x 9um. Interchangeable scanner nose cones let users switch imaging modes quickly and conveniently.

The Agilent 5600LS is compatible with contact mode, acoustic AC mode, phase imaging, STM, LFM, EFM, MFM, force modulation, current sensing and MAC Mode III. Agilent's patented MAC Mode III provides three user-configurable lock-in amplifiers, affording researchers virtually limitless application possibilities and unprecedented speed. It allows single-pass imaging concurrent with KFM/EFM, facilitates vertical or lateral modulation studies, and supports the use of higher resonance modes of the cantilever.
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