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News

NanoSight enhances nanoparticle characterization software to improve performance

NanoSight : 09 September, 2008  (New Product)
NanoSight has enhanced its nanoparticle characterization software for the company’s family of Nanoparticle Tracking Analysis (NTA) instrumentation.
The software’s new Extended Analysis solution answers two key questions for users of NTA (Nanoparticle Tracking Analysis): How long should a user run an analysis and how many particles does the user need to measure to get a statistically good result?

The two are interdependent: the longer the analysis time, the more particles are counted, as the contents of the interrogated volume self-refresh through diffusion. NanoSight’s NTA 2.0 now analyses particles as they are detected, eliminating the need to record for post experiment analysis thus speeding use and repeatability. Users may now run analyses far longer and improve the development of the optimal analysis time.

Extended Dynamic Range is achieved through the interleaving of alternate video frames at high and then low gain settings will help users track large and small particles in the same sample, thus increasing dynamic range. For example, four clear peaks are readily observed for a mix of latex reference particles of 50, 200, 400 and 590nm.

The 3D Diameter Scatter Plot shows diameter plotted against scatter intensity to both boost resolution and provide a capability to differentiate similar sized particles when they are of differing materials. In these analyses, a third axis plots scatter intensity against the existing particle size distribution of number count versus size. In the figure shown, the analysis allows the presence of dimer particles to be seen and contrasted to slightly larger but significantly brighter particles.

The last new benefit is derived from Model-Fitting. The enhancement compensates for the natural broadening of displayed results. The broadening is inherent in the stochastic nature of Brownian motion and the physical limitation of only being able to track particles for a finite number of frames. Model-Fitting works by compensating for the number of tracks (consecutive jumps, frame to frame) used in the NTA analysis. The solution compensates for the Gaussian breadth of the curve where its origin is understood. Users are able to apply this feature to specific peaks displayed in the particle size analysis. The background to this development was described by Professor Paul Van der Meeren in his presentation at the PSA 2008 conference held in Stratford-upon-Avon, UK.

While current users will benefit from these developments through receiving a free upgrade, these and other routines have been introduced with all new systems at no increased charge reflecting NanoSight’s commitment to be at the leading edge in instrumentation for nanoparticle characterization.
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